923698

The 923 series Test Clip with headless head provides downsized series made of smaller components and higher densities. Now hard to access surface-mount ICs can be connected to test probes and logical assemblies quickly and easily without the risk of shorting out clips or damaging other board components. The surface-mount test clips are available in different pin sizes to accommodate a wide range of requirements. The industrial standard 0.25-inch square contact pins on 0.05-inch centres are staggered to permit easy attachment of IDC socket connectors or wire wrapping and help prevent shorting of adjacent probes. The clip allows safe, accurate and convenient testing of plastic leaded chip carrier (PLCC) and ceramic leadless chip carrier (LCC) style integrated circuits. The unique action wedge design of the test clip allows all four of its side to open simultaneously for one step, secure attachment to the PLCC being tested.

• Available in through-hole and surface-mount
• Helical compression spring and insulating contact combs ensure contact integrity during testing
• Probe access points are immediately visible for fast and safe individual lead testing
• Staggered contact rows facilitate probe attachment & prevent accidental shorting of adjacent probes
• With positive attachment to device, test clip will not fall off when board is vertical
• Wiping action and high nominal force combine to provide excellent electrical contact
• Gold alloy plated leads
• High normal force
• Excellent electrical contact
• Long-term performance